Cascade Engineering’s Failure Analysis Lab capabilities includeC computerized scanning acoustic microscopy (CSAM).
The Scanning Acoustic Tomography process uses ultra high frequency ultrasound as an effective and commonly used technique for identifying silicon defects such as voids, cracks and de-laminations in electronic components.
Our labs CSAM facilities complement the other X-ray visualization we provide. As acoustic imaging is very sensitive to the elastic properties of materials it is more sensitive for detecting air space type defects. Together, the various imaging tools and techniques provide comprehensive analysis to build a more complete picture of the cause of failure.